Name: Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Price: 128.89 EUR
Availability: InStock
Author: Michael,Sawyer,Lifshin,Echlin,Lyman,Joy,Newbury,Goldstein
ISBN: 9780306472923

portada Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

Type

Physical Book

Publisher

Springer

Author

Michael,Sawyer,Lifshin,Echlin,Lyman,Joy,Newbury,Goldstein

Year

2007

Language

English

Pages

689

Format

Hardcover

Weight

ISBN

0306472929

ISBN13

9780306472923

Synopsis "Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition "

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition - Michael,Sawyer,Lifshin,Echlin,Lyman,Joy,Newbury,Goldstein

Synopsis "Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition "

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