Tracked shipping to Austria with premium packaging for just 3,99 € 

Ship to
Austria
0
  • argentina
  • chile
  • colombia
  • españa
  • méxico
  • perú
  • estados unidos
  • internacional

Select your country

Americas

Europe

Rest of the world

portada Thermal Conductivity Measurements in Atomically Thin Materials and Devices
Type
Physical Book
Publisher
Language
English
Pages
50
Format
Paperback
Dimensions
23.4 x 15.6 x 0.4 cm
Weight
0.11 kg.
ISBN13
9789811553479

Thermal Conductivity Measurements in Atomically Thin Materials and Devices

T. Serkan Kasirga (Author) · Springer · Paperback

Thermal Conductivity Measurements in Atomically Thin Materials and Devices - Kasirga, T. Serkan

Cheaper New Book Imported to Austria
Delivery: 22 Jul - 29 Jul Shipping: 13 to 17 business days.
63,75 €
Faster New Book Imported to Austria
Delivery: 10 Jul - 14 Jul Shipping: 5 to 6 business days.
83,99 €
Import costs and 10% VAT included in the price ✅
63,75 €

Synopsis "Thermal Conductivity Measurements in Atomically Thin Materials and Devices "

This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects.

Customers reviews

Frequently Asked Questions about the Book

All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.

Questions and Answers about the Book

Do you have a question about the book? Login to be able to add your own question.

Opinions about Bookdelivery

More customer reviews