Name: Strain Effect in Semiconductors: Theory and Device Applications
Price: 176.51 EUR
Availability: InStock
Author: Sun, Yongke ; Thompson, Scott E. ; Nishida, Toshikazu
ISBN: 9781489983152

portada Strain Effect in Semiconductors: Theory and Device Applications

Strain Effect in Semiconductors: Theory and Device Applications

Type

Physical Book

Author

Publisher

Language

English

Pages

350

Format

Paperback

Dimensions

23.4 x 15.6 x 1.9 cm

Weight

0.51 kg.

ISBN13

9781489983152

Synopsis "Strain Effect in Semiconductors: Theory and Device Applications"

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.

Customers reviews

Have you read this book? Login to add your review.

More customer reviews

0% (0)
0% (0)
0% (0)
0% (0)
0% (0)

Questions and Answers about the Book

Do you have a question about the book? Login to be able to add your own question.

Opinions about Bookdelivery

More customer reviews

Strain Effect in Semiconductors: Theory and Device Applications - Sun, Yongke ; Thompson, Scott E. ; Nishida, Toshikazu

Synopsis "Strain Effect in Semiconductors: Theory and Device Applications"

Customers reviews

Frequently Asked Questions about the Book

Is the book original?

In what language is the book written?

What is the format of this book?

Questions and Answers about the Book

Opinions about Bookdelivery