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portada Bias Temperature Instability for Devices and Circuits
Type
Physical Book
Publisher
Year
2013
Language
English
Pages
810
Format
Hardcover
ISBN13
9781461479086
Edition No.
2014
Categories

Bias Temperature Instability for Devices and Circuits

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Synopsis "Bias Temperature Instability for Devices and Circuits "

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

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The book is written in English.

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The binding of this edition is Hardcover.

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