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portada Advanced Computing in Electron Microscopy
Type
Physical Book
Author
Publisher
Language
English
Pages
354
Format
Paperback
Dimensions
23.4 x 15.6 x 1.9 cm
Weight
0.51 kg.
ISBN13
9783030332624
Edition No.
0003
Categories

Advanced Computing in Electron Microscopy

Earl J. Kirkland (Author) · Springer · Paperback

Advanced Computing in Electron Microscopy - Kirkland, Earl J.

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Synopsis "Advanced Computing in Electron Microscopy"

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

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