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portada Yield-Aware Analog IC Design and Optimization in Nanometer-Scale Technologies
Type
Physical Book
Author
Publisher
Language
English
Pages
237
Format
Paperback
Dimensions
23.4 x 15.6 x 1.4 cm
Weight
0.37 kg.
ISBN13
9783030415389
Categories

Yield-Aware Analog IC Design and Optimization in Nanometer-Scale Technologies

Nuno Cavaco Gomes Horta (Author) · António Manuel Lourenço Canelas (Author) · Jorge Manuel Correia Guilherme (Author) · Springer · Paperback

Yield-Aware Analog IC Design and Optimization in Nanometer-Scale Technologies - Canelas, António Manuel Lourenço ; Guilherme, Jorge Manuel Correia ; Horta, Nuno Cavaco Gomes

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Synopsis "Yield-Aware Analog IC Design and Optimization in Nanometer-Scale Technologies"

This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC simulations using foundry statistical device models considering local and global variations. The methodology described by the authors delivers on average a reduction of 89% in the total number of MC simulations, when compared to the exhaustive MC analysis over the full population. In addition to describing a newly developed yield estimation technique, the authors also provide detailed background on automatic analog IC sizing and optimization.

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