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portada reliability wearout mechanisms in advanced cmos technologies
reliability wearout mechanisms in advanced cmos technologiesreliability wearout mechanisms in advanced cmos technologies
Type
Physical Book
Author
Publisher
Language
English
Pages
624
Format
Hardcover
Dimensions
23.6 x 16.3 x 3.3 cm
Weight
0.98 kg.
ISBN
0471731722
ISBN13
9780471731726
Categories

reliability wearout mechanisms in advanced cmos technologies

Alvin W. Strong (Author) · Ernest Y. Wu (Author) · Rolf-Peter Vollertsen (Author) · Wiley-IEEE Press · Hardcover

reliability wearout mechanisms in advanced cmos technologies - Strong, Alvin W. ; Wu, Ernest Y. ; Vollertsen, Rolf-Peter

New Book Imported to Austria
Delivery: 03 Aug - 05 Aug Shipping: 6 to 7 business days.
199,11 €
Import costs and 10% VAT included in the price ✅
199,11 €

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Synopsis "reliability wearout mechanisms in advanced cmos technologies"

This invaluable resource tells the complete story of failure mechanisms--from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.

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The binding of this edition is Hardcover.

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