Name: ionizing radiation effects in mos devices and circuits
Price: 377.73 EUR
Availability: InStock
Author: Ma, T. P. ; Dressendorfer, Paul V.
ISBN: 9780471848936

portada ionizing radiation effects in mos devices and circuits

ionizing radiation effects in mos devices and circuits

Type

Physical Book

Illustrated by

T. P. Ma

Paul V. Dressendorfer

Publisher

Wiley-Interscience

Author

Ma, T. P. ; Dressendorfer, Paul V.

Year

1989

Language

English

Pages

608

Format

Hardcover

Dimensions

24.4 x 16.7 x 3.4 cm

Weight

0.95 kg.

ISBN

047184893x

ISBN13

9780471848936

Synopsis "ionizing radiation effects in mos devices and circuits"

This is the first comprehensive overview describing the effects of ionizing radiation on MOS devices, and how to design, fabricate, and test integrated circuits intended for use in a radiation environment. It also addresses process-induced radiation effects in the fabrication of high-density circuits, and reviews the history of radiation-hard technology, providing background information for those new to the field. The book includes a comprehensive review of the literature, and an annotated listing of research activities in radiation-hardness research. The volume will be of benefit to semi conductor process development engineers, device and circuit development engineers, device physicists, reliability assurance engineers, project managers and stress analysts.

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ionizing radiation effects in mos devices and circuits - Ma, T. P. ; Dressendorfer, Paul V.

Synopsis "ionizing radiation effects in mos devices and circuits"

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