Ship to
Austria
0
  • argentina
  • chile
  • colombia
  • españa
  • méxico
  • perú
  • estados unidos
  • internacional

Select your country

Americas

Europe

Rest of the world

portada Atomic Force Microscopy: Biomedical Methods and Applications
Type
Physical Book
Publisher
Language
English
Pages
394
Format
Paperback
Dimensions
22.9 x 15.2 x 2.1 cm
Weight
0.55 kg.
ISBN13
9781489939319

Atomic Force Microscopy: Biomedical Methods and Applications

Braga, Pier Carlo ; Ricci, Davide (Author) · Humana · Paperback

Atomic Force Microscopy: Biomedical Methods and Applications - Braga, Pier Carlo ; Ricci, Davide

Cheaper New Book Imported to Austria
Delivery: 20 Aug - 27 Aug Shipping: 12 to 16 business days.
149,12 €
Faster New Book Imported to Austria
Delivery: 10 Aug - 12 Aug Shipping: 4 to 5 business days.
197,44 €
Import costs and 10% VAT included in the price ✅
149,12 €

Synopsis "Atomic Force Microscopy: Biomedical Methods and Applications"

The natural, biological, medical, and related sciences would not be what they are today without the microscope. After the introduction of the optical microscope, a second breakthrough in morphostructural surface analysis occurred in the 1940s with the development of the scanning electron microscope (SEM), which, instead of light (i. e., photons) and glass lenses, uses electrons and electromagnetic lenses (magnetic coils). Optical and scanning (or transmission) electron microscopes are called "far-field microscopes" because of the long distance between the sample and the point at which the image is obtained in comparison with the wavelengths of the photons or electrons involved. In this case, the image is a diffraction pattern and its resolution is wavelength limited. In 1986, a completely new type of microscopy was proposed, which, without the use of lenses, photons, or electrons, directly explores the sample surface by means of mechanical scanning, thus opening up unexpected possibilities for the morphostructural and mechanical analysis of biological specimens. These new scanning probe microscopes are based on the concept of near-field microscopy, which overcomes the problem of the limited diffraction-related resolution inherent in conventional microscopes. Located in the immediate vicinity of the sample itself (usually within a few nanometers), the probe records the intensity, rather than the interference signal, thus significantly improving resolution. Since the most we- known microscopes of this type operate using atomic forces, they are frequently referred to as atomic force microscopes (AFMs).

Customers reviews

Frequently Asked Questions about the Book

All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.

Questions and Answers about the Book

Do you have a question about the book? Login to be able to add your own question.

Opinions about Bookdelivery

More customer reviews